📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

High-accuracy analysis of nanoscale semiconductor layers using beam-exit ar-ion polishing and scanning probe microscopy. (2013)

First Author: Robson AJ
Attributed to:  Coupling of single quantum dots to two-dimensional systems funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/am400270w

PubMed Identifier: 23528037

Publication URI: http://europepmc.org/abstract/MED/23528037

Type: Journal Article/Review

Volume: 5

Parent Publication: ACS applied materials & interfaces

Issue: 8

ISSN: 1944-8244