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Air Stable Cross-Linked Cytop Ultrathin Gate Dielectric for High Yield Low-Voltage Top-Gate Organic Field-Effect Transistors (2010)

First Author: Cheng X

Attributed to: IKC in Advanced Manufacturing Technologies for Photonics and Electronics - Exploiting Molecular and Macromolecular Materials [MMM] funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/cm902929b

Publication URI: http://dx.doi.org/10.1021/cm902929b

Type: Journal Article/Review

Parent Publication: Chemistry of Materials

Issue: 4