Air Stable Cross-Linked Cytop Ultrathin Gate Dielectric for High Yield Low-Voltage Top-Gate Organic Field-Effect Transistors (2010)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/cm902929b
Publication URI: http://dx.doi.org/10.1021/cm902929b
Type: Journal Article/Review
Parent Publication: Chemistry of Materials
Issue: 4