Determination of proton- and oxide ion tracer diffusion in lanthanum tungstate (La/W = 5.6) by means of ToF-SIMS. (2012)

First Author: Hancke R
Attributed to:  Determination of Surface and Interface Processes in Materials Science funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c2cp42278f

PubMed Identifier: 22986702

Publication URI: http://europepmc.org/abstract/MED/22986702

Type: Journal Article/Review

Volume: 14

Parent Publication: Physical chemistry chemical physics : PCCP

Issue: 40

ISSN: 1463-9076