Actively stabilized optical fiber interferometry technique for online/in-process surface measurement. (2008)
Attributed to:
A chip device for on-line assessment in nano-scale surface manufacture
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.2870085
PubMed Identifier: 18315285
Publication URI: http://europepmc.org/abstract/MED/18315285
Type: Journal Article/Review
Volume: 79
Parent Publication: The Review of scientific instruments
Issue: 2 Pt 1
ISSN: 0034-6748