The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy (2008)
Attributed to:
A COMPACT, FAST, PARALLEL, MAGNETICALLY BASED ELECTRON ENERGY ANALYSER FOR SURFACE STUDIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3039804
Publication URI: http://dx.doi.org/10.1063/1.3039804
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 12