qPlus atomic force microscopy of the Si(100) surface: Buckled, split-off, and added dimers (2009)

First Author: Sweetman A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3197595

Publication URI: http://dx.doi.org/10.1063/1.3197595

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 6