Scanning capacitance microscopy studies of unintentional doping in epitaxial lateral overgrowth GaN (2009)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3259379

Publication URI: http://dx.doi.org/10.1063/1.3259379

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 10