Elastic relaxation in an ultrathin strained silicon-on-insulator structure (2011)
Attributed to:
Coherent Surface X-ray Diffraction investigation of Thiol-induced structural changes in Gold
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3637634
Publication URI: http://dx.doi.org/10.1063/1.3637634
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 11