Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering (2012)
Attributed to:
Determination of Surface and Interface Processes in Materials Science
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4758699
Publication URI: http://dx.doi.org/10.1063/1.4758699
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 15