Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering (2012)

First Author: Téllez H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4758699

Publication URI: http://dx.doi.org/10.1063/1.4758699

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 15