Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra (2012)

First Author: Ishii M
Attributed to:  Silicon emission technologies based on nanocrystals funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4772475

Publication URI: http://dx.doi.org/10.1063/1.4772475

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 24