Studying atomic scale structural and electronic properties of ion implanted silicon samples using cross-sectional scanning tunneling microscopy (2013)

First Author: Studer P
Attributed to:  Organic molecular films on semiconductors for device applications funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4772508

Publication URI: http://dx.doi.org/10.1063/1.4772508

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 1