Iron-induced deep-level acceptor center in GaN/AlGaN high electron mobility transistors: Energy level and cross section (2013)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4793196

Publication URI: http://dx.doi.org/10.1063/1.4793196

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 7