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Analysis of electron capture at oxide traps by electric field injection (2013)

First Author: Engstrom O

Attributed to: High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4807845

Publication URI: http://dx.doi.org/10.1063/1.4807845

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 21