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Stress distribution of GaN layer grown on micro-pillar patterned GaN templates (2013)

First Author: Nagarajan S

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4813077

Publication URI: http://dx.doi.org/10.1063/1.4813077

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 1