Characterization of Fe-N nanocrystals and nitrogen-containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy (2013)

First Author: Kovács A
Attributed to:  SuperSTEM - the UK aberration-corrected STEM facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4816049

Publication URI: http://dx.doi.org/10.1063/1.4816049

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 3