Atomic-scale distortion of optically activated Sm dopants identified with site-selective X-ray absorption spectroscopy (2013)
Attributed to:
Silicon emission technologies based on nanocrystals
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4824375
Publication URI: http://dx.doi.org/10.1063/1.4824375
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 13