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Defect identification in strained Si/SiGe heterolayers for device applications (2009)

First Author: Escobedo-Cousin E

Attributed to: Platform: Strained Si / SiGe: Materials, Technology and Design funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/17/175306

Publication URI: http://dx.doi.org/10.1088/0022-3727/42/17/175306

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 17