Defect identification in strained Si/SiGe heterolayers for device applications (2009)
Attributed to:
Platform: Strained Si / SiGe: Materials, Technology and Design
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/17/175306
Publication URI: http://dx.doi.org/10.1088/0022-3727/42/17/175306
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 17