White-light bias external quantum efficiency measurements of standard and inverted P3HT : PCBM photovoltaic cells (2012)

First Author: Brenner T
Attributed to:  Interfacial domain structure of polycrystalline semiconducting polymer films funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/45/41/415101

Publication URI: http://dx.doi.org/10.1088/0022-3727/45/41/415101

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 41