Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias. (2012)

First Author: Sweetman A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0953-8984/24/8/084009

PubMed Identifier: 22310449

Publication URI: http://europepmc.org/abstract/MED/22310449

Type: Journal Article/Review

Volume: 24

Parent Publication: Journal of physics. Condensed matter : an Institute of Physics journal

Issue: 8

ISSN: 0953-8984