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Error mapping of high-speed AFM systems (2013)

First Author: Klapetek P

Attributed to: Guided access to High-speed Contact Atomic Force Microscopy and Photonic Force Microscopy at the Nanoscience and Quantum Information Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-0233/24/2/025006

Publication URI: http://dx.doi.org/10.1088/0957-0233/24/2/025006

Type: Journal Article/Review

Parent Publication: Measurement Science and Technology

Issue: 2