Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging (2010)
Attributed to:
Development of X-ray Ptychography at the Diamond Light Source for the study of Domain Walls in Cu3Au.
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1367-2630/12/3/035013
Publication URI: http://dx.doi.org/10.1088/1367-2630/12/3/035013
Type: Journal Article/Review
Parent Publication: New Journal of Physics
Issue: 3