Radiation-induced bending of silicon-on-insulator nanowires probed by coherent x-ray diffractive imaging (2012)
Attributed to:
Phase modulation technology for X-ray imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1367-2630/14/6/063029
Publication URI: http://dx.doi.org/10.1088/1367-2630/14/6/063029
Type: Journal Article/Review
Parent Publication: New Journal of Physics
Issue: 6