A novel wafer-scale CMOS APS X-ray detector for breast cancer diagnosis using X-ray diffraction studies (2012)
Attributed to:
MI-3 Plus
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/7/12/c12005
Publication URI: http://dx.doi.org/10.1088/1748-0221/7/12/c12005
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 12