Further development of surface metrology methods for predicting the functional performance of flexible photovoltaic barrier films (2013)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Advanced Metrology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2051-672x/1/1/015006
Publication URI: http://dx.doi.org/10.1088/2051-672x/1/1/015006
Type: Journal Article/Review
Parent Publication: Surface Topography: Metrology and Properties
Issue: 1