Surface profile measurement using spatially dispersed short coherence interferometry (2014)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Advanced Metrology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2051-672x/2/2/024001
Publication URI: http://dx.doi.org/10.1088/2051-672x/2/2/024001
Type: Journal Article/Review
Parent Publication: Surface Topography: Metrology and Properties
Issue: 2