InN/GaN valence band offset: High-resolution x-ray photoemission spectroscopy measurements (2008)
Attributed to:
Growth and Electronic Properties of InN and N-rich Alloys
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.78.033308
Publication URI: http://dx.doi.org/10.1103/physrevb.78.033308
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 3