System-size convergence of point defect properties: The case of the silicon vacancy (2011)
Attributed to:
Modelling of Advanced Functional Materials using Terascale Computing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.84.035209
Publication URI: http://dx.doi.org/10.1103/physrevb.84.035209
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 3