Surface Electron Accumulation and the Charge Neutrality Level in In 2 O 3 (2008)
Attributed to:
Surface and interface electronic properties of emerging oxide semiconductors: a feasibility study of CdO
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.101.116808
PubMed Identifier: 18851315
Publication URI: http://europepmc.org/abstract/MED/18851315
Type: Journal Article/Review
Parent Publication: Physical Review Letters
Issue: 11
ISSN: 0031-9007