Very low energy implanted Bragg gratings in SOI for wafer scale testing applications (2011)
Attributed to:
UK Silicon Photonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/group4.2011.6053712
Publication URI: http://dx.doi.org/10.1109/group4.2011.6053712
Type: Conference/Paper/Proceeding/Abstract
ISBN: 978-1-4244-8338-9