Characterisation of electroplated NiFe films using test structures and wafer mapped measurements (2011)

First Author: Murray J
Attributed to:  An Innovative Electronics Manufacturing Research Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icmts.2011.5976861

Publication URI: http://dx.doi.org/10.1109/icmts.2011.5976861

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4244-8526-0