Statistical variability and reliability in nanoscale FinFETs (2011)

First Author: Wang X
Attributed to:  Atomic Scale Simulation of Nanoelectronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iedm.2011.6131494

Publication URI: http://dx.doi.org/10.1109/iedm.2011.6131494

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4577-0506-9