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Design metrics for RTL level estimation of delay variability due to intradie (random) variations (2010)

First Author: Merrett M

Attributed to: Meeting the design challenges of the nano-CMOS electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iscas.2010.5537133

Publication URI: http://dx.doi.org/10.1109/iscas.2010.5537133

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4244-5308-5