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Secondary image reconstruction based on Associative Markov Networks for electrical resistance tomography (2012)

First Author: Ye J

Attributed to: SPEC_SENSE: Fast Spectroscopic Sensing and Measurement Products for Characterisation of Industrial Processes funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ist.2012.6295495

Publication URI: http://dx.doi.org/10.1109/ist.2012.6295495

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4577-1776-5