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Impact of STI on Statistical Variability and Reliability of Decananometer MOSFETs (2011)

First Author: Wang X

Attributed to: Meeting the design challenges of the nano-CMOS electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2011.2108256

Publication URI: http://dx.doi.org/10.1109/led.2011.2108256

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 4