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Impact of NBTI/PBTI on SRAM Stability Degradation (2011)

First Author: Cheng B

Attributed to: ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2011.2136316

Publication URI: http://dx.doi.org/10.1109/led.2011.2136316

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 6