Development of a RF waveform stress test procedure for GaN HFETs subjected to infinite VSWR sweeps (2012)

First Author: McGenn W
Attributed to:  Holistic Design of Power Amplifiers for Future Wireless Systems funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/mwsym.2012.6259725

Publication URI: http://dx.doi.org/10.1109/mwsym.2012.6259725

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4673-1085-7