Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models (2010)
Attributed to:
Meeting the design challenges of the nano-CMOS electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tcsi.2010.2043988
Publication URI: http://dx.doi.org/10.1109/tcsi.2010.2043988
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Circuits and Systems I: Regular Papers
Issue: 5