Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models (2010)

First Author: Tong Boon Tang
Attributed to:  Meeting the design challenges of the nano-CMOS electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcsi.2010.2043988

Publication URI: http://dx.doi.org/10.1109/tcsi.2010.2043988

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Circuits and Systems I: Regular Papers

Issue: 5