Statistical Threshold-Voltage Variability in Scaled Decananometer Bulk HKMG MOSFETs: A Full-Scale 3-D Simulation Scaling Study (2011)
Attributed to:
ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2011.2149531
Publication URI: http://dx.doi.org/10.1109/ted.2011.2149531
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 8