Evaluation of Semiconductor Based Methods for Fault Isolation on High Voltage DC Grids (2013)

First Author: Hajian M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tsg.2013.2238260

Publication URI: http://dx.doi.org/10.1109/tsg.2013.2238260

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Smart Grid

Issue: 2