Initialization-Based Test Pattern Generation for Asynchronous Circuits (2010)

First Author: Efthymiou A
Attributed to:  SElf-timed DATapath synthEsis (SEDATE) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tvlsi.2009.2013470

Publication URI: http://dx.doi.org/10.1109/tvlsi.2009.2013470

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Issue: 4