Delay Test for Diagnosis of Power Switches (2014)
Attributed to:
Variation-Aware Test for NanoScale CMOS Integrated Circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tvlsi.2013.2239319
Publication URI: http://dx.doi.org/10.1109/tvlsi.2013.2239319
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue: 2