Using Synchrotron X-Ray Nano-CT to Characterize SOFC Electrode Microstructures in Three-Dimensions at Operating Temperature (2011)
Attributed to:
Multiscale x-ray imaging facility for monitoring and modelling structural evolution in situ
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1149/1.3615824
Publication URI: http://dx.doi.org/10.1149/1.3615824
Type: Journal Article/Review
Parent Publication: Electrochemical and Solid-State Letters
Issue: 10