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Using Synchrotron X-Ray Nano-CT to Characterize SOFC Electrode Microstructures in Three-Dimensions at Operating Temperature (2011)

First Author: Shearing P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1149/1.3615824

Publication URI: http://dx.doi.org/10.1149/1.3615824

Type: Journal Article/Review

Parent Publication: Electrochemical and Solid-State Letters

Issue: 10