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Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology. (2007)

First Author: Zhang Z

Attributed to: Micron Resolution Full-Field Shape Metrology for High Value Engineering Applications funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/ao.46.006113

PubMed Identifier: 17712375

Publication URI: http://europepmc.org/abstract/MED/17712375

Type: Journal Article/Review

Volume: 46

Parent Publication: Applied optics

Issue: 24

ISSN: 1559-128X