Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures. (2013)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.21.016629
PubMed Identifier: 23938514
Publication URI: http://europepmc.org/abstract/MED/23938514
Type: Journal Article/Review
Volume: 21
Parent Publication: Optics express
Issue: 14
ISSN: 1094-4087