Multiwavelength interferometry: extended range metrology. (2009)
Attributed to:
Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ol.34.000950
PubMed Identifier: 19340181
Publication URI: http://europepmc.org/abstract/MED/19340181
Type: Journal Article/Review
Volume: 34
Parent Publication: Optics letters
Issue: 7
ISSN: 0146-9592