Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction (2010)
Attributed to:
Coherent Surface X-ray Diffraction investigation of Thiol-induced structural changes in Gold
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1524/zkri.2010.1354
Publication URI: http://dx.doi.org/10.1524/zkri.2010.1354
Type: Journal Article/Review
Parent Publication: Zeitschrift für Kristallographie
Issue: 12